Re: RF code scanners

From: Mister Coffee (live4java_at_stormcenter.net)
Date: 06/25/04

  • Next message: Martin Murray-Brown: "RE: Limited vs full blown testing" 
    Date: Fri, 25 Jun 2004 08:30:50 -0700
To: "Ng, Kenneth (US)" <kenng@kpmg.com>

    On Wed, Jun 23, 2004 at 03:06:26PM -0400, Ng, Kenneth (US) wrote:
    > Depends on how cheaply the unit was designed. I remember putting in back to
    > back diodes on the front gates to protect against stuff like static
    > discharge. If this was done, you would have to generate a HELL of a lot of
    > EMF to blow these out. Time to bring out the van-de-graf generator :-).
    > But in this era of cheaper cheaper cheaper, I bet these aren't there
    > anymore. What will probably happen is you'll DOS the box. The AGC on the
    > front end will try to cut the signal back as far as it can, probably not
    > enough, the decoders won't see a clear signal/sequence, so will probably
    > fail to engage. But I wouldn't be surprised if you burned out a front end.
    >
    <<much snipping>>
    >
    I'm incluned to agree that a low end unit will probably scatter parts if you hit it with enough power. Which, I suspect, would lead it to "fail closed", with the gate/door/what have you still locked.

    As has been mentioned, simply jamming the thing would be a piece of cake. In the context of a pen-test, you could probably combine a Remote Door DOS with a bit of social engineering to gain entrance to a prem, if it was within the scope of your test.

    Cheers,
    L4J

  • Next message: Martin Murray-Brown: "RE: Limited vs full blown testing"